STEVE SPEER: New York | New Work

CKG is pleased to present Steve Spear's newest series, New York | New Work, in collaboration with the Exposure Photography Festival. Well-known throughout the local photographic community, Steve has been a key player in promoting, educating and representing photography as an art form. Additionally, Steve actively exhibits as part of the Lumian Collective, a group of active photographers from various creative backgrounds/careers. 

Steve's black and white images mesmerize the viewer with their amazingly high level of detail. Each brick and leaf can be seen; recorded by our eyes as part of a larger weaving of patterns that compose the urban environment of NYC that a visitor rarely takes in when visiting the city. They are at one glance both micro and macro. The crisp blank ink doesn't overwhelm or overstimulate the eyes. You can get lost in them for a moment or even days. 

Steve says of this series - 

"My work in architectural street photography is an exploration of structure, form, and the intricate language of urban design and the built environment. In New York City, architecture stands as both art and artifact—a testament to human ambition and creativity. Through my images, I seek to distill the city’s complexity into moments of clarity, where light, shadow, and geometry converge to tell a cohesive story.

The interplay of materials—glass, steel, brick, and stone—creates a visual rhythm that defines the character and depth of each neighborhood. I am particularly drawn to the interplay between modern and historic, the clean lines of contemporary design juxtaposed with the textured patina of the past. By focusing on architectural elements and the spaces between them, my work reveals the patterns and details that might otherwise go unnoticed.

Through composition and attention to form, my photographs celebrate the artistry and beauty of urban architecture. Viewers are invited to consider the structural beauty of the cityscape and the enduring impact of design on the urban experience".